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Encounter Timing System

Encounter Timing System

  • 品牌:Cadence
  • 包装:--
  • 无铅情况/ROHS: --
  • 经营商:科通芯城自营
  • 描述:Serves both front-end logic designers looking for high-quality static timing analysis and ease of use, as well as back-end implementation engineers requiring electrical analysis and a common timing engine for silicon-accurate signoff.
  • 封装:--
  • 类别:逻辑设计



Encounter Timing System is a full-chip static timing analysis (STA) solution providing gate-level delay calculation, signoff-level timing and signal integrity (SI) analysis, statistical timing and leakage analysis, advanced on-chip variation analysis, and advanced node functionality required for double-patterning and waveform effects.

Encounter Timing System removes the iteration bottleneck by providing a consistent, integrated Common Timing Engine for both the design implementation stage and the final timing verification stage of the design cycle. The result is correlation and convergence between implementation and signoff for faster timing closure.

Benefits
  • Advanced timing solution with comprehensive analysis
    • Delay calculation
    • Static timing analysis
    • SI analysis
    • Statistical timing analysis
    • On-chip variation analysis
  • Integrated with EDI System
    • Consistent timing analysis during implementation throughout the flow and signoff at the end of the flow
    • Faster design convergence and timing closure with smaller design margin
    • Common database infrastructure for fast setup and a consistent usage model throughout the flow
  • Unmatched timing signoff accuracy
    • Prevents excessive over-design to exceed performance, power, and area targets
    • Delivers accurate base delay and SI delay calculation to within 2-5% of SPICE
    • Leverages current source models for greater accuracy on mainstream and advanced node designs
    • Offers built-in critical path simulation for delay and SI correlation with SPICE
  • Higher throughput for shorter design cycles and faster time to design signoff
    • End-to-end multi-threaded timing and SI analysis for faster signoff turnaround
    • Concurrent multi-mode/multi-corner (MMMC) timing and SI analysis for large view-count designs
    • Distributed multi-CPU and multithreaded processing for maximum hardware utilization
  • Higher productivity to shorten tapeout schedules by weeks
    • Industry-renowned global timing debug to accelerate root-cause and bottleneck analysis
    • MMMC-aware timing debug for quick timing issue identification across all views
    • MMMC signoff ECO optimization and repair across all timing views for fewer ECO cycles
  • Supported by major foundries, ASIC, and IP vendors, and used exclusively by multiple IDMs for signoff

Success Story
序号 PDF 描述
1 Cadence and NetEffect Success Story Cadence and NetEffect Success Story
2 Cadence and Renesas Success Story Cadence and Renesas Success Story
Demo
序号 PDF 描述
1 Cadence Encounter Digital IC Design Demo: Necessary and Absolute Signoff Analysis for 65/45nm Design Cadence Encounter Digital IC Design Demo: Necessary and Absolute Signoff Analysis for 65/45nm Design
Brochure
序号 PDF 描述
1 Cadence Encounter Digital IC Design Platform Brochure Cadence Encounter Digital IC Design Platform Brochure
Datasheet
序号 PDF 描述
1 Common Platform Datasheet for Cadence 65nm Low-Power Reference Flow Common Platform Datasheet for Cadence 65nm Low-Power Reference Flow
2 Encounter Timing System Datasheet Encounter Timing System Datasheet
Conference Paper
序号 PDF 描述
1 Designing Out DFM Issues at 65 nm Designing Out DFM Issues at 65 nm
2 Fast and Accurate Statistical Cell Characterization with Spectre Fast and Accurate Statistical Cell Characterization with Spectre
3 Validation and Debugging of Statistical Analysis - Key to Robustness of Cadence SSTA solution Validation and Debugging of Statistical Analysis - Key to Robustness of Cadence SSTA solution
Cadence Article
序号 PDF 描述
1 Interview: Freescale's Alex Albuerne uses Encounter Timing System to Overcome Timing Challenges Interview: Freescale's Alex Albuerne uses Encounter Timing System to Overcome Timing Challenges
2 Interview: Making Reliable Models for SSTA Interview: Making Reliable Models for SSTA
联系我们

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+86 400 8830 393

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