When digital simulation became common-place in the 1980s, flows were simple: RTL, then gate, then implement. In the intervening years, simulation has matured into verification and become the critical means to enable productivity, predictability, and quality in modern, complex FPGAs, ASICs, and custom designs. As part of that maturation, new means for generating metrics to measure the progress against the verification plan, new abstractions for both digital and analog simulation moving verification earlier in the process, and new means for speeding convergence have emerged. IES continues to lead these changes in the verification process by adding new technology to support each of these new niches that have emerged making IES the most used engine in the industry.
Today, the Cadence® Incisive® Enterprise Simulator fuels testbench automation, reuse, and analysis to verify designs from the system level, through RTL, to the gate level. It supports the metric-driven approach implemented by the Incisive Enterprise Manager. Its native-compiled architecture speeds the simultaneous simulation of transaction-level, behavioral, low-power, RTL, and gate-level models, eliminating the performance degradation often seen in other simulation approaches.
Incisive Enterprise Simulator also supports all IEEE-standard languages, the (OVM), the emerging Accellera Universal Verification Methodology (UVM), and the e Reuse Methodology (eRM), so engineers can quickly and easily integrate it with established verification flows. Verification engineers can extend the functionality of Enterprise Simulator with , which provide a high-throughput channel between the testbench and the device under test (DUT), and enable automated metric driven verification of embedded software exactly as if it were another part of the DUT.
Benefits
- Fuels testbench automation, analysis, and reuse for increased productivity
- Ensures verification quality by tracking industry-standard coverage metrics, including functional, transactional, low-power, and HDL code, plus automatic data and assertion checking
- Drives and guides verification with an automatically backannotated and executable verification plan
- Creates reusable sequences and multi-channel virtual sequences on top of a multi-language verification environment
- Configures existing Universal Verification Components (UVCs) or quickly constructs all-new UVCs
- Enables advanced debug using SimVision for transaction-level models, SystemVerilog/e class libraries, transient mixed-signal, low-power, and traditional waveform analysis
- Supports e, Open Verification Library (OVL), OVM class library, emerging UVM class library, SystemC®, SystemC Verification Library, SystemVerilog, Verilog®, VHDL, PSL, SVA, and CPF
- Delivers the highest possible performance for mixed-language, mixed-signal, and low-power designs, across multiple levels of abstraction, including the ability to “hot swap” the RTL simulation in/out of the Palladium XP series of accelerators/emulators
文档类型:
Datasheet Conference Paper eBook White Paper Application Brief Cadence Article Release Information Technical Paper Success Story| 序号 | 描述 | |
|---|---|---|
| 1 | Incisive Enterprise Simulator Datasheet | Incisive Enterprise Simulator Datasheet |
| 2 | Cadence Export Model Packager Datasheet | Cadence Export Model Packager Datasheet |
| 序号 | 描述 | |
|---|---|---|
| 1 | Where OOP Falls Short of Hardware Verification Needs Conference Paper Presented at DVCon 2010 | Where OOP Falls Short of Hardware Verification Needs Conference Paper Presented at DVCon 2010 |
| 2 | Verification Test Sequence Reuse from Block to System within Incisive Plan-to-Closure Methodology | Verification Test Sequence Reuse from Block to System within Incisive Plan-to-Closure Methodology |
| 3 | Plan-to-Silicon: Functional Test Automation using the Incisive Platform and Plan-to-Closure Methodol | Plan-to-Silicon: Functional Test Automation using the Incisive Platform and Plan-to-Closure Methodology |
| 4 | Module- or Class-Based URM? A Pragmatic Guide to Creating Verification Environments in SystemVerilog | Module- or Class-Based URM? A Pragmatic Guide to Creating Verification Environments in SystemVerilog |
| 5 | Mixed Signal Verification of Dynamic Adaptive Power Conference Paper Presented at DVCon 2010 | Mixed Signal Verification of Dynamic Adaptive Power Conference Paper Presented at DVCon 2010 |
| 6 | Integrating Design IP and Verification IP to Ensure Quality and Predictability | Integrating Design IP and Verification IP to Ensure Quality and Predictability |
| 7 | Apples versus Apples HVL Comparison Finally Arrives Conference Paper Presented at DVCon 2010 | Apples versus Apples HVL Comparison Finally Arrives Conference Paper Presented at DVCon 2010 |
| 8 | Implementing an Automated Checking Scheme for a Video-Processing Device | Implementing an Automated Checking Scheme for a Video-Processing Device |
| 9 | Functional Closure using the Plan-to-Closure Methodology | Functional Closure using the Plan-to-Closure Methodology |
| 10 | Developing a Gigabit Ethernet VIP Using The Plan-to-Closure Methodology Featuring SystemVerilog | Developing a Gigabit Ethernet VIP Using The Plan-to-Closure Methodology Featuring SystemVerilog |
| 11 | Coverage-Driven AMS Verification of a 4Mb Z-RAM Macro | Coverage-Driven AMS Verification of a 4Mb Z-RAM Macro |
| 12 | Building a SystemVerilog Universal Verification Component with the Incisive Plan-to-Closure Methodol | Building a SystemVerilog Universal Verification Component with the Incisive Plan-to-Closure Methodology |
| 序号 | 描述 | |
|---|---|---|
| 1 | Practical Guide to Low-Power Design - User Experience with CPF | Practical Guide to Low-Power Design - User Experience with CPF |
| 序号 | 描述 | |
|---|---|---|
| 1 | Power-Aware Verification Spans IC Design Cycle White Paper | Power-Aware Verification Spans IC Design Cycle White Paper |
| 2 | Metric-Driven Verification Ensures Software Development Quality White Paper | Metric-Driven Verification Ensures Software Development Quality White Paper |
| 3 | Enterprise System-Level (ESL) Verification Solution Beyond "First Silicon Success" White Paper | Enterprise System-Level (ESL) Verification Solution Beyond "First Silicon Success" White Paper |
| 序号 | 描述 | |
|---|---|---|
| 1 | Modeling for Stimulus Generation, EZ-start Guide | Modeling for Stimulus Generation, EZ-start Guide |
| 序号 | 描述 | |
|---|---|---|
| 1 | Interview: Verification Planning and Management Methodology Focuses on All the Right Things | Interview: Verification Planning and Management Methodology Focuses on All the Right Things |
| 2 | Interview: Closing in on Profitability with Leading-Edge Verification Practices | Interview: Closing in on Profitability with Leading-Edge Verification Practices |
| 序号 | 描述 | |
|---|---|---|
| 1 | Interview: By Popular Demand—SystemVerilog Open Verification Methodology | Interview: By Popular Demand—SystemVerilog Open Verification Methodology |
| 序号 | 描述 | |
|---|---|---|
| 1 | Hardware Simulator Performance Scaling to Meet Advanced Node SoC Verification Requirements Technical | Hardware Simulator Performance Scaling to Meet Advanced Node SoC Verification Requirements Technical Paper |
| 2 | Developing a Gigabit Ethernet VIP Using the Plan to Closure Methodology Featuring SystemVerilogpdf | Developing a Gigabit Ethernet VIP Using the Plan to Closure Methodology Featuring SystemVerilogpdf |
| 序号 | 描述 | |
|---|---|---|
| 1 | Cadence and Xilinx Success Story | Cadence and Xilinx Success Story |
| 2 | Cadence and Silicon Laboratories | Cadence and Silicon Laboratories |
| 3 | Cadence and Siemens Sucess Story | Cadence and Siemens Sucess Story |
| 4 | Cadence and LSI Corporation Success Story | Cadence and LSI Corporation Success Story |
